陈嘉耕

华中师范大学


Curriculum vitae


[email protected]


QQ: 939288955


计算机学院

伍伦贡联合研究院

湖北省武汉市洪山区珞喻路152号华中师范大学


A New Class of RC4 Colliding Key Pairs with Greater Hamming Distance


Conference paper


Jiageng Chen, Atsuko Miyaji
Lecture Notes in Computer Science, Jin Kwak, Robert H. Deng, Yoojae Won, Guilin Wang, Information Security, Practice and Experience, 6th International Conference, {ISPEC} 2010, Seoul, Korea, May 12-13, 2010. Proceedings, vol. 6047, Springer, 2010, pp. 30--44

Cite

Cite

APA   Click to copy
Chen, J., & Miyaji, A. (2010). A New Class of RC4 Colliding Key Pairs with Greater Hamming Distance. In J. Kwak, R. H. Deng, Y. Won, & G. Wang (Eds.), Information Security, Practice and Experience, 6th International Conference, {ISPEC} 2010, Seoul, Korea, May 12-13, 2010. Proceedings (Vol. 6047, pp. 30–44). Springer.


Chicago/Turabian   Click to copy
Chen, Jiageng, and Atsuko Miyaji. “A New Class of RC4 Colliding Key Pairs with Greater Hamming Distance.” In Information Security, Practice and Experience, 6th International Conference, {ISPEC} 2010, Seoul, Korea, May 12-13, 2010. Proceedings, edited by Jin Kwak, Robert H. Deng, Yoojae Won, and Guilin Wang, 6047:30–44. Lecture Notes in Computer Science. Springer, 2010.


MLA   Click to copy
Chen, Jiageng, and Atsuko Miyaji. “A New Class of RC4 Colliding Key Pairs with Greater Hamming Distance.” Information Security, Practice and Experience, 6th International Conference, {ISPEC} 2010, Seoul, Korea, May 12-13, 2010. Proceedings, edited by Jin Kwak et al., vol. 6047, Springer, 2010, pp. 30–44.


BibTeX   Click to copy

@inproceedings{chen2010a,
  title = {A New Class of RC4 Colliding Key Pairs with Greater Hamming Distance},
  year = {2010},
  pages = {30--44},
  publisher = {Springer},
  series = {Lecture Notes in Computer Science},
  volume = {6047},
  author = {Chen, Jiageng and Miyaji, Atsuko},
  editor = {Kwak, Jin and Deng, Robert H. and Won, Yoojae and Wang, Guilin},
  booktitle = {Information Security, Practice and Experience, 6th International Conference, {ISPEC} 2010, Seoul, Korea, May 12-13, 2010. Proceedings}
}


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